Engineering & Materials Science
Substrates
100%
Transconductance
71%
Capacitance
62%
Oxides
52%
Foundries
42%
Noise figure
42%
Networks (circuits)
37%
Doping (additives)
36%
Low noise amplifiers
32%
Semiconductor doping
31%
MOSFET devices
31%
Scattering parameters
30%
Electric potential
29%
Varactors
28%
System-on-chip
28%
Threshold voltage
28%
Capacitors
26%
Ultra-wideband (UWB)
26%
Drain current
26%
Telegraph
26%
Analytical models
26%
Degradation
26%
Eddy currents
25%
Cutoff frequency
25%
Skin effect
24%
Silicon
24%
Circuit simulation
23%
Flash memory
22%
Millimeter waves
20%
Broadband amplifiers
20%
Thermal noise
18%
Electric lines
18%
Equivalent circuits
17%
Inductance
15%
Variable frequency oscillators
15%
Metals
15%
Hole mobility
15%
Mixer circuits
15%
Interface states
14%
Parameter extraction
13%
Negative bias temperature instability
13%
Electrons
13%
Transceivers
13%
Analog circuits
13%
Hardware security
11%
FinFET
11%
Durability
11%
Costs
11%
Protons
11%
Defects
11%
Physics & Astronomy
CMOS
80%
inductors
79%
layouts
57%
chips
55%
field effect transistors
52%
broadband
40%
low noise
32%
performance
27%
Q factors
24%
flicker
23%
axial strain
21%
low frequencies
20%
metal oxide semiconductors
19%
analogs
19%
optimization
17%
simulation
17%
capacitance
16%
eddy currents
15%
low voltage
15%
amplifiers
14%
current amplifiers
14%
systems-on-a-chip
13%
capacitors
13%
sudden ionospheric disturbances
13%
MIM (semiconductors)
13%
augmentation
12%
design optimization
12%
foundries
12%
logic
12%
transconductance
11%
millimeter waves
11%
scaling
10%
hole mobility
10%
costs
10%
silicon
10%
engineering
9%
manufacturing
9%
RLC circuits
9%
time dependence
8%
conductors
8%
inductance
8%
bombardment
8%
halos
8%
power gain
8%
degradation
8%
threshold voltage
8%
modules
7%
anomalies
7%
electrical resistivity
7%
metals
7%
Chemical Compounds
Inductor
94%
Parasitic
82%
Transconductance
66%
Simulation
36%
Compound Mobility
34%
Flicker Noise
34%
Interface Trap
33%
Point Group C∞V
29%
Eddy Current
28%
Drain Current
28%
Capacitor
28%
Resistance
27%
Trap Density Measurement
21%
Length
21%
Fluorescence Maxima
20%
Dielectric Material
19%
Tunneling
18%
Oxide
18%
Voltage
16%
Coil
14%
Inductance
14%
Epitaxial Film
13%
Foundry
13%
Conductor
11%
Reduction
9%
Doping Material
8%
Indicator
8%
Entropy
7%
Dimension
7%
Application
7%
Interface State
7%
Semiconductor
7%
Charge Pumping
6%
Metal
6%
Proton
6%
Size Reduction
6%
Intramuscular
5%
Cmin
5%
Flow
5%
