Personal profile
Education/Academic qualification
PhD, 電子研究所, National Yang Ming Chiao Tung University
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Dive into the research topics where Chun-Yu Lin is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Projects
- 1 Finished
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Development of Neurophysiological Monitoring Chip and Electrical Stimulator
Lin, C.-Y. (PI)
1/05/13 → 31/07/13
Project: Government Ministry › Other Government Ministry Institute
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3xVDD-tolerant power-rail ESD clamp circuit for negative mixed-voltage interfaces
Cheng, H. E., Wu, C. L. & Lin, C. Y., Nov 2025, In: Solid-State Electronics. 229, 109185.Research output: Contribution to journal › Article › peer-review
1 Scopus citations -
Cost-Efficient Bidirectional ESD Protection for 650-V GaN Power HEMT With Co-Packaged Transient Voltage Suppressor
Ker, C. C., Lin, C. Y., Ker, M. D., Chiang, T. Y., Wang, C. C. & Jiang, R., 2025, (Accepted/In press) In: IEEE Transactions on Device and Materials Reliability.Research output: Contribution to journal › Article › peer-review
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Dependence of N-Well Guard Ring Bias on Latch-up Failure Level in a HV/LV Mixed-Voltage CMOS IC
Ker, C. C., Hsu, C. W., Lin, C.-Y., Ker, M. D., Wang, C. C. & Chiang, T. Y., 2025, 2025 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2025 - Proceedings of Technical Papers. Institute of Electrical and Electronics Engineers Inc., (2025 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2025 - Proceedings of Technical Papers).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Gate-to-source ESD protection design for GaN-on-silicon power HEMT
Ker, C. C., Lin, C. Y., Ker, M. D., Chang, Y. H., Li, C. W., Chiang, T. Y. & Wang, C. C., Dec 2025, In: Microelectronics Reliability. 175, 115948.Research output: Contribution to journal › Article › peer-review
1 Scopus citations -
Power-Clamp-Triggered SCR for Broadband RF ESD Protection
Cheng, H. E. & Lin, C. Y., 2025, In: IEEE Transactions on Electron Devices. 72, 12, p. 6460-6465 6 p.Research output: Contribution to journal › Article › peer-review
1 Scopus citations