Engineering & Materials Science
Oxides
100%
Annealing
70%
Plasmas
69%
Germanium
66%
Substrates
65%
Gate dielectrics
60%
Metals
53%
Thin film transistors
49%
Interface states
40%
Leakage currents
40%
Polysilicon
40%
MOSFET devices
38%
Flash memory
38%
Silicon
34%
Ferroelectric materials
33%
Data storage equipment
33%
Buffer layers
32%
Electric properties
32%
Field effect transistors
29%
Aluminum oxide
29%
Thin films
28%
Oxide semiconductors
27%
Charge trapping
27%
Nanocrystals
27%
Doping (additives)
26%
Capacitors
25%
Temperature
24%
Degradation
22%
Thermodynamic stability
22%
Nitrides
21%
Atomic layer deposition
21%
Silicon oxides
20%
X ray photoelectron spectroscopy
20%
Transistors
19%
Chemical vapor deposition
18%
FinFET
18%
Electrodes
18%
Nitrogen
18%
Electric potential
17%
Hafnium
17%
Oxidation
15%
Silicates
15%
Nickel
15%
Nitridation
15%
Hafnium oxides
14%
Semiconductor materials
14%
Capacitance
14%
Bismuth
13%
Crystallization
13%
MOS capacitors
13%
Chemical Compounds
Dielectric Material
62%
Oxide
57%
Annealing
47%
Leakage Current
47%
Field Effect
39%
Capacitor
39%
Electrical Property
25%
Plasma
23%
Voltage
23%
Liquid Film
23%
Hafnium Atom
19%
Interface State
18%
Atomic Layer Epitaxy
18%
Metal
15%
Buffer Solution
15%
Density of Interface States
15%
Semiconductor
14%
Thermal Stability
14%
Compound Mobility
12%
Transconductance
12%
Contact Resistance
12%
X-Ray Photoelectron Spectroscopy
12%
Nonconductor
12%
Tunneling
11%
Hot Electron
11%
Application
11%
Laser Annealing
11%
Rapid Thermal Annealing
11%
Nanocrystal
10%
Diffusion
10%
Electron Particle
10%
Metal Oxide
9%
Germanide
9%
Hysteresis
9%
Surface
9%
Point Group C∞V
8%
Doping Material
8%
Behavior as Electrode
8%
Ashing
8%
Schottky Barrier
8%
Epitaxial Growth
8%
Electric Field
8%
Plasma Chemical Vapour Deposition
8%
Electronic Band Structure
8%
Alloy
8%
Nitride
7%
Conductance
7%
Microwave
7%
Retention Time
7%
Band Gap
7%
Physics & Astronomy
metal oxide semiconductors
35%
field effect transistors
34%
oxides
32%
annealing
27%
trapping
23%
thin films
22%
leakage
21%
transistors
19%
capacitors
18%
flash
14%
capacitance
14%
silicon
13%
electrical properties
12%
nanocrystals
12%
bismuth
12%
strontium
12%
buffers
11%
silicon oxides
11%
germanium
11%
performance
10%
nitrogen
10%
metals
10%
gels
10%
insulators
10%
nitrides
10%
electric potential
9%
damage
9%
cerium oxides
9%
tantalum
8%
traps
8%
degradation
8%
nickel
8%
hafnium oxides
8%
thermal stability
7%
electrodes
7%
endurance
7%
electric contacts
7%
breakdown
7%
silicates
7%
CMOS
7%
passivity
7%
hafnium
7%
oxidation
6%
hysteresis
6%
temperature
6%
atomic layer epitaxy
6%
retarding
6%
boron
6%
MIS (semiconductors)
6%