Department of Mechanical Engineering

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2023
Dynamic on-state resistance instability characterization of a multi-chip-GaN MIS-HEMTs cascode power module
Elangovan, S., Cheng, S., Jang, W. Y. & Chang, E. Y., Jul 2023, In: Electronics Letters. 59, 13, e12824.
Research output: Contribution to journal › Letter › peer-review

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