Research output per year
Research output per year
Research output
Search results
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2019
A note on Group Selection with multiple quality characteristics: power comparison of two methods
Pearn, W. L., Lin, C. J., Chen, Y. H. & Huang, J. Y., 4 Mar 2019, In: International Journal of Production Research. 57, 5, p. 1366-1370 5 p.Research output: Contribution to journal › Comment/debate
3 Scopus citations -
2016
Erratum to: On Different-Dimensional Deployment Problems of Hybrid VANET-Sensor Networks with QoS Considerations (Mobile Networks and Applications, 10.1007/s11036-015-0667-3)
Lin, C.-C., Chen, P. C. & Chang, L. W., 1 Oct 2016, In: Mobile Networks and Applications. 21, 5, p. 902-904 3 p.Research output: Contribution to journal › Comment/debate
Open Access -
2012
Erratum: Multi-server machine repair model with standbys and synchronous multiple vacation (Computers and Industria Engineering (2012) 62 (296-305))
Ke, J. C. & Wu, C.-H., 1 May 2012, In: Computers and Industrial Engineering. 62, 4, 1 p.Research output: Contribution to journal › Comment/debate
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2010
Cost-benefit analysis of RFID application in apparel retailing for SME: A case from Taiwan
Wen, T. A. C., Chang, Y.-C. & Chang, K. H. U., 2010, In: Transportation Journal. 49, 3, p. 57-66 10 p.Research output: Contribution to journal › Comment/debate
10 Scopus citations -
2009
Erratum to "reliability assessment of an aircraft propulsion system using IFS and OWA tree " [Engineering Optimization 40(10) (2008) 907-921]
Chang, K. H., Cheng, C. H. & Chang, Y.-C., 1 Mar 2009, In: Engineering Optimization. 41, 3, 1 p.Research output: Contribution to journal › Comment/debate
Open Access -
2003
Erratum: An algorithm for calculating the lower confidence bounds of CPU and CPL with application to low-drop-out linear regulators (Microelectronics Reliability (2003) 43 (495-502))
Pearn, W. L. & Shu, M. H., 1 Aug 2003, In: Microelectronics Reliability. 43, 8, 1 p.Research output: Contribution to journal › Comment/debate