Department of Industrial Engineering and Management

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  • 2004

    Drawing graphs with nonuniform nodes using potential fields

    Chuang, J-H., Lin, C-C. & Yen, H. C., 1 Jan 2004, Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). Liotta, G. (ed.). Springer Verlag, p. 460-465 6 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 2912).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    11 Scopus citations
  • Planning yields in recycling test wafers

    Wu, M-C., Chien, C. S. & Lu, K. S., 1 Dec 2004, 2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW. p. 141-144 4 p. (2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2002

    Scrap rules for small lots in wafer fabrication

    Wu, M-C., Chiou, C. W. & Hsu, H. M., 1 Jan 2002, 2002 Semiconductor Manufacturing Technology Workshop, SMTW 2002. Institute of Electrical and Electronics Engineers Inc., p. 187-190 4 p. 1197410. (2002 Semiconductor Manufacturing Technology Workshop, SMTW 2002).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations